Refer to Problem 4.6. The wafers are also classified by thickness of silicon coating(z=0, low; z=1), high.. The first five imperfection counts reported for each treatment refer to z=0 and the last five refer to z=1. Analyze these data.

 

Percent

 

Percent

 

Percent

Decade

Complete

Decade

Complete

Decade

Complete

1900-1909

72.7

1930-1939

44.3

1960-1969

27.2

1910-1919

63.4

1940-1949

41.6

1970-1979

22.5

1920-1929

50.0

1950-1959

32.8

1980-1989

13.3

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